As of right now, there are two distinct testing plans. The first one being material and device characterization. The silver and MnO2 materials will be characterized with the following techniques:
- SEM (Scanning Electron Microscopy) for morphology
- AFM (Atomic Force Microscopy) for morphology and phase testing
- C-AFM (Conductive Atomic Force Microscopy) for conductive testing in local regions of a film to see if conductivity is the same throughout
- FTIR (Fourier Trasnfer Infrared Spectroscopy) to identify the chemical species
- Powder XRD (X-Ray Diffraction) to identify the crystal structure of a material or system
- CV (Cyclic Voltammetry) for device electrical performance
- EIS (Electrochemical Impedance Spectroscopy) device wide impedance testing
After determining these properties with these methods, the device will be put in a system (second plan) with the following block diagram (a full circuit coming soon, will be able to design once there is a clear idea of the device’s impedance):
